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Keysight U7228C USB Preamplifier, 100 MHz to 26.5 GHz, Cable-less

Embedded smart features and benefits:

  • Automatic gain correction value with temperature compensation and transfer of calibration data (noise figure and S-parameters) through USB plug and play features for improved noise figure measurements when used with X-Series signal analyzers
  • Excellent noise figure and optimized gain with the X-Series signal analyzers improves measurement accuracy and minimizes uncertainty
  • Provides broadband operating frequency from 100 MHz up to 26.5 GHz for various applications
  • Rugged and portable design for bench top measurements or remote front end field applications

Product Number:

U7228C

Manufacturer:

Keysight Technologies

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The U7228C, 100 MHz to 26.5 GHz USB preamplifier is designed to bring reliable gain and low noise figure to measurement systems improving the overall system performance and reduce systematic errors; a total solution to the Keysight X-Series signal analyzers to perform noise figure measurements.

When connected to the X-Series signal analyzers, the USB preamplifiers can automatically configure the analyzers to detect the specific preamplifier connected, and download the embedded calibration data such as gain, noise figure and S-parameters. The calibration data provides accurate correction data and more repeatable results for each actual measurement made.

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Description
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The U7228C, 100 MHz to 26.5 GHz USB preamplifier is designed to bring reliable gain and low noise figure to measurement systems improving the overall system performance and reduce systematic errors; a total solution to the Keysight X-Series signal analyzers to perform noise figure measurements.

When connected to the X-Series signal analyzers, the USB preamplifiers can automatically configure the analyzers to detect the specific preamplifier connected, and download the embedded calibration data such as gain, noise figure and S-parameters. The calibration data provides accurate correction data and more repeatable results for each actual measurement made.

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