We use cookies in order to guarantee the best possible service. If you continue browsing the site you consent to our cookie use.

Keysight D9030DDRC DDR3 and LPDDR3 Tx Compliance Software

Key Features & Specifications

  • Compliance testing of clock jitter, electrical and timing measurements in accordance to JEDEC specifications.
  • Superior signal integrity and probing that meets DDR3 and LPDDR3 measurement needs.
  • JEDEC test measurement with navigation capability for DDR debug.
  • Statistical analysis on read or write data for margin testing.
  • Data analytics capabilities which include data import into data repository server and aggregate test results viewing

Product Number:

D9030DDRC

Manufacturer:

Keysight Technologies

Quantity:

Total
Unit price
base price
Stock
Call or email for delivery time

Use the DDR3 and LPDDR3 application to test, debug and characterize your DDR3 and LPDDR3 designs quickly and easily. It automatically configures the oscilloscope for each test and generates an informative HTML report at the end of the test. The application not only compare the results with the specification test limit but also includes margin analysis which indicates how closely the device passes or fails each test. In addition, the complex analysis of the DDR3 and LPDDR3 signals is taken cared by the application which saves user time and effort if the measurements are done manually.

Description
Additional Informations
Reviews
Query on the Item
Do you have any questions on this item?
Your E-mail Address
My Question:
Please retype the letters shown here
captcha
Description
Reviews
Query on the Item

Use the DDR3 and LPDDR3 application to test, debug and characterize your DDR3 and LPDDR3 designs quickly and easily. It automatically configures the oscilloscope for each test and generates an informative HTML report at the end of the test. The application not only compare the results with the specification test limit but also includes margin analysis which indicates how closely the device passes or fails each test. In addition, the complex analysis of the DDR3 and LPDDR3 signals is taken cared by the application which saves user time and effort if the measurements are done manually.

Do you have any questions on this item?
Your E-mail Address
My Question:
Please retype the letters shown here
captcha